In today’s semiconductor factories, it’s become increasingly difficult and time-consuming to generate valid data for factory productivity solutions.

To address this gap, Applied Materials is developing a common data model using the Extract, Transform and Map (ETL) capabilities modules from Applied’s APF (Advanced Productivity Platform) software environment.

Figure 1 below shows steps involved in building the common data model schema

Smartfactory productivity solutions components

Smartfactory productivity solutions components
Common framework from dispaching to automation — Built on Smartfactory Platform ETM, Common Data Model (CDM), EngineeredWorks, Solution UI > Open Box Solutions

Applied solution leverages out of box APF adapters to integrate the data from various sources such as MES, MCS and other applications in the CIM solution.

Figure 2 shows the data intercepted from various solutions in APF repository

Once the data is replicated in APF repository then it is mapped to the common data model schema using APF macros as shown in figure 3

Extract, Transpose, and MAP(ETM)

Once the data is transformed in the common data model format then it is ready to get used in various factory productivity solutions.

Figure 4 shows some of the snapshot of various tables

Recently, Applied Materials has been using this approach to rapidly deploy Factory Productivity solutions within 6 months.
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