SmartFactory Run-to-Run Control for Semiconductor Manufacturing

Optimize tool recipe parameters — improve Cpk, cut scrap events, and hold process capability through ramp

Process capability drifts as equipment and processes age, and manual recipe tuning cannot keep pace with it. Run-to-Run Control adjusts tool recipe parameters automatically to hold Cpk where it needs to be.

What is Run-to-Run Control?

Applied SmartFactory Run-to-Run Control is an advanced process control (APC) solution that improves process capability (Cpk) and optimizes tool recipe parameters. The out-of-box solution offers patented model prediction, including a multivariant, constrained, optimization-based process controller with proven deployment success. For engineering teams, run-to-run control is what keeps a qualified process qualified. Rather than waiting for a capability review to reveal drift, the controller compensates run by run using measurements the process already produces.

How does Run-to-Run Control improve yield?

Applied SmartFactory Run-to-Run Control improves yield by reducing the process variation that kills yield during high-volume manufacturing, and by supporting better decisions through development and ramp. Fabs see roughly 30% average Cpk improvement, 10–30% fewer scrap events, and a 2–4% increase in mature yield. Automatically optimizing recipe parameters compensates for equipment and process drift before it produces out-of-spec material.

Why choose Run-to-Run Control?

30% average Cpk improvement

10–30% reduction in scrap events

2–4% increase in mature yield

What can you gain from our approach?

Improved yield

  • Reduces process variation
  • Enables better decision-making during development and ramp phases of production
  • Reduces yield killing process variation during high volume manufacturing

Improved quality

  • Improves Cpk by automatically optimizing tool recipe parameters
  • Reduces out of spec (OOS) and scrap events by compensating for drifts from equipment and processes
  • Improves throughput by reducing pilot wafers

Lower cost of ownership

  • Reduces model management activities through a unified modeling structure
  • Offers common platform with integration to SPC and FDC to promote information sharing

Run-to-Run Control FAQ

What is run-to-run control in semiconductor manufacturing?

Run-to-run control is an advanced process control approach that adjusts tool recipe parameters between runs to hold a process on target. Applied SmartFactory Run-to-Run Control does this with patented model prediction built around a multivariant, constrained, optimization-based process controller.

How does Run-to-Run Control improve Cpk?

It improves Cpk by automatically optimizing tool recipe parameters rather than waiting for an engineer to retune them, which fabs report as roughly 30% average Cpk improvement. Holding capability steady is what reduces the yield-killing process variation that appears in high-volume manufacturing.

Does Run-to-Run Control reduce scrap and out-of-spec material?

Yes. It reduces out-of-spec and scrap events by compensating for drifts from equipment and processes, with reported reductions of 10–30% in scrap events and a 2–4% increase in mature yield.

How does Run-to-Run Control affect throughput?

It improves throughput by reducing pilot wafers. Where a controller can predict and correct parameter settings, fewer wafers are consumed proving out a process before production material runs.

What is involved in managing the control models?

A unified modeling structure reduces model management activities, so the ongoing effort of maintaining controllers does not scale linearly with the number of processes under control. That is a significant part of the lower cost of ownership.

Does Run-to-Run Control integrate with SPC and FDC?

Yes. It offers a common platform with integration to SPC and FDC to promote information sharing, so statistical violations, equipment faults, and control actions are interpreted against the same data rather than in separate systems.

Ready to hold process capability as your fab ramps?

Run-to-Run Control optimizes tool recipe parameters automatically, so Cpk holds through development, ramp, and high-volume production.