Advanced Semiconductor Manufacturing Conference (ASMC)
Hilton Albany, New York
May 5-8, 2025
Implementation & Application of coherent control systems: Digital Twin (high frequency open loop) with Run-to-Run (low frequency closed loop)
Tue, May 6, 2025 at 1:15 pm – 2:40 pm
Session 3: Advanced Process Control 1
This session discusses process control schemes utilizing advanced data analytics, computational algorithms and statistical methods to improve wafer process steps, yield and cost.
Pratik Kotcher
R2R Solution Architect
Automation Products Group, Applied Materials
Applied Materials Authors:
Pratik Kotcher
Kasturi Sarang
Miller Allen
