Semiconductor Quality
Integrating the functions of Statistical Process Control (SPC) and Fault Detection (FD) helps semiconductor manufacturers achieve higher quality, reliability, and efficiency
Achieve better detection, decision making, and costs through unified process control
Explore AI-driven process quality improvement with SmartFactory’s UPC solution in this engaging article by Applied SmartFactory.
Automating analytics reduces defects, optimizing continuous improvement
This blog series discusses strategies, priorities, and challenges manufacturers face to automate factories of any size to move the needle towards zero defects manufacturing
Increase yield and reduce costs of non-quality in automotive manufacturing
Improve yield learning and accelerate yield ramp using an integrated yield analysis solution
Quickly determine root cause of failures using complete, integrated defect analysis solution
Extend automation intelligence capabilities in your factory with cohesive OCAP solution using SmartFactory Knowledge Advisor.
The latest release of SmartFactory Recipe Management offers better data synchronization options for runtime recipe control.
Building a quality ecosystem in your fab with pre-integrated SmartFactory Yield and Defect Management solutions
Learn how to steer the automotive electronic revolution by doubling down on a zero-defect mindset to reduce the cost of non-quality.
